Two-wavelength Grating Interferometry for Extended Range MEMS Metrology

Abstract

Diffraction gratings integrated with MEMS has many applications as they can offer shot noise limited sub-nm displacement detection sensitivities but are limited in range. A two-wavelength readout method is developed that maintains high sensitivity while increasing the detection range from 105 nm to 1.7 um assuming sensitivity is maintained at >50% of the maximum sensitivity.

Publication
In 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics ,95 , Hualien, Taiwan
M. Fatih Toy
M. Fatih Toy
Associate Professor of Electrical and Electronics Engineering

My research interests include digital holography, quantitative phase imaging, optical diffraction tomography and optical superresolution.

Onur Ferhanoglu
Onur Ferhanoglu
Associate Professor